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Published February 13, 2017 | Version v1

TID Tolerance of commercial 130nm CMOS Technologies for HEP experiments

Authors/Creators

  • 1. Birmingham U

Contributors

  • 1. INFN Turin

Files

CERN-THESIS-2006-150.pdf

Files (2.2 MB)

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Additional details

Identifiers

CDS
2252791
CDS Report Number
CERN-THESIS-2006-150

CERN

Department
PH - Physics Department
Programme
No program participation
Accelerator
CERN SLHC
Experiment
ATLAS

Linked records